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제품 및 솔루션

  • 제품 및 솔루션
  • TEM cameras
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    ultra-fast 4D STEM and in-situ TEM Celeritas
  • Direct detection device (DDD®) delivers ultra-low noise and extraordinary resolution for almost any beam brightness.
  • Orders of magnitude faster than other detectors (up to 87,000 fps)
  • 1k x 1k (1 million) seamless pixels for a broad range of TEM/STEM methods.
  • ultra-fast 4D STEM and in-situ TEM
    Celeritas
  • Direct detection device (DDD®) delivers ultra-low noise and extraordinary resolution for almost any beam brightness.
  • Orders of magnitude faster than other detectors (up to 87,000 fps)
  • 1k x 1k (1 million) seamless pixels for a broad range of TEM/STEM methods.
  • Product Features 제품특징

    Celeritas

    Orders of magnitude faster than other detectors (up to 87,000 fps)
    1k x 1k (1 million) seamless pixels for a broad range of TEM/STEM methods.
    On-chip CDS minimizes noise.
    Simultaneous HDR readout delivers more than an order of magnitude higher dynamic range.
    Patented HDR counting automatically performs electron counting in sparse regions while maintaining linearity in bright regions.

    • Unique Readout Architecture to Maximize Speed

      Conventional CMOS image sensors(including both scintillator-coupled cameras and direct detectors) output each frame as a series of rows, read out from top to bottom. While this strategy is simple it results in limited output speed, especially for smaller ROIs. At best, the frame rate can scale with the Y dimension.

      The Celeritas sensor is seamlessly segmented into quadrants, operating in parallel and read out from the center of the sensor. This advanced architecture enables ultra-fast output, scaling with ROI in both the X and Y directions.

    Specifications 제품사양
    Specifications
    TEM electron energysensitive to 60 keV - 1.25 MeV │ optimized for 200 - 300 keV
    pixel array size1024 x 1024 (1 million pixels) │ 15μm pixel pitch
    single electron SNR>50:1 (200-300 keV)
    sensor designcustom-designed ultra-fast DDD sensor
    on-chip correlated double sampling (CDS) │ backthinned │ radiation hardened
    acquisition modesintegrating mode │ electron counting mode
    HDR counting mode (US patent #11,252,339)
    exposure rateup to 107e-/pixel/second (300 keV, with selectable gain or simultaneous HDR)
    TEM compatibilityall major TEM manufacturers & models │ DE-FreeScan requires STEM capability
    mounting positionfully retractable │ compatible with a wide-range of TEM configurations
    typically in TEM bottom port, pre- or post-energy filter, or in JEOL film drawer
    sensor protectionsensor protection shutter │ TEM blanking/shuttering │ failsaft software
    computer systemhigh-performance computer │ Windows 10 │ Nvidia GPU(s) │ up to 55 TB storage
    image formatnon-proprietary │ HDF5, MRC, TIFF, or TIFF LZW
    compatible with ImageJ, LiberTEM, Hyperspy, Py4DSTEM, etc.
    automation softwareSerialEM │ open API for custom integrations (with Python, C, C++, C#, etc.)
    integrationsCEFID post-column energt filter (CEOS) │ precession diffraction (Nanomegas)
    scan controlDE-FreeScan scan controller (also includes 4 analog detector inputs)
    hardware synchronization signal (BNC) │ selectable as either input or output